Empirical determination of the energy band gap narrowing in p silicon heavily doped with boron

Abstract

In the analysis of highly doped silicon, energy band gap narrowing (BGN) and degeneracy effects may be accounted for separately, as a net BGN in conjunction with Fermi-Dirac statistics, or lumped together in an apparent BGN used with Boltzmann statistics. This paper presents an experimental study of silicon highly doped with boron, with the aim of evaluating the applicability of previously reported BGN models. Different boron diffusions covering a broad range of dopant densities were prepared, and their characteristic recombination current parameters J0 were measured using a contactless photoconductance technique. The BGN was subsequently extracted by matching theoretical simulations of carr..