Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
Andrew J Morgan, Kevin T Murray, Mauro Prasciolu, Holger Fleckenstein, Oleksandr Yefanov, Pablo Villanueva-Perez, Valerio Mariani, Martin Domaracky, Manuela Kuhn, Steve Aplin, Istvan Mohacsi, Marc Messerschmidt, Karolina Stachnik, Yang Du, Anja Burkhart, Alke Meents, Evgeny Nazaretski, Hanfei Yan, Xiaojing Huang, Yong S Chu Show all
Journal of Applied Crystallography | INT UNION CRYSTALLOGRAPHY | Published : 2020
Awarded by NSF
Awarded by Cluster of Excellence 'CUI: Advanced Imaging of Matter' of the DFG
Awarded by DOE Office of Science
Funding for this project was provided by the Australian Research Council Centre of Excellence in Advanced Molecular Imaging (AMI), the Gottfried Wilhelm Leibniz Program of the Deutsche Forschungsgemeinschaft (DFG), the NSF award 1231306 and the Cluster of Excellence 'CUI: Advanced Imaging of Matter' of the DFG - EXC 2056 project ID 390715994. This research used the HXN beamline of the National Synchrotron Light Source II, a US Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under contract No. DE-SC0012704.