Journal article

Investigation of charge carrier trapping in H-terminated diamond devices

CT-K Lew, N Dontschuk, DA Broadway, J-P Tetienne, JC McCallum, LCL Hollenberg, BC Johnson

Applied Physics Letters | AMER INST PHYSICS | Published : 2020


Surfaces and interfaces can dominate charge carrier transport dynamics in electronic devices, impeding realization of a material's full potential. Here, we investigate transport in a two-terminal diamond device comprising a conductive channel defined by a hydrogen-terminated diamond surface, bridging two TiC contacts. The surface charge distribution was imaged by monitoring the photoluminescence of nitrogen vacancy centers incorporated below the active device layer. A strong charge accumulation near the TiC contact/H-terminated channel interface is observed and is discussed in terms of deviation from Ohmic behavior evident in the DC electrical measurements. Small voltage steps applied to the..

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Awarded by Australian Research Council (ARC)

Funding Acknowledgements

We thank Daniel J. McCloskey and Steve A. Yanni for useful discussions. This work was supported by the Australian Research Council (ARC) through Grant Nos. DE170100129 and CE170100012. C.T.-K.L. and D.A.B. were supported by an Australian Government Research Training Program Scholarship.