Journal article
Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't
Scott Findlay, Leslie Allen, Hamish Brown, Zhen Chen, Jim Ciston, Yuichi Ikuhara, Ryo Ishikawa, Colin Ophus, Gabriel Sánchez-Santolino, Takehito Seki, Naoya Shibata, Matthew Weyland
Microscopy and Microanalysis | Oxford University Press (OUP) | Published : 2020