Journal article
Scalable Atomic Arrays for Spin-Based Quantum Computers in Silicon
AM Jakob, SG Robson, HR Firgau, V Mourik, V Schmitt, D Holmes, M Posselt, ELH Mayes, D Spemann, JC McCallum, A Morello, DN Jamieson
Advanced Materials | WILEY-V C H VERLAG GMBH | Published : 2024
Abstract
Semiconductor spin qubits combine excellent quantum performance with the prospect of manufacturing quantum devices using industry-standard metal-oxide-semiconductor (MOS) processes. This applies also to ion-implanted donor spins, which further afford exceptional coherence times and large Hilbert space dimension in their nuclear spin. Here multiple strategies are demonstrated and integrated to manufacture scale-up donor-based quantum computers. 31PF2 molecule implants are used to triple the placement certainty compared to 31P ions, while attaining 99.99% confidence in detecting the implant. Similar confidence is retained by implanting heavier atoms such as 123Sb and 209Bi, which represent hig..
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Grants
Awarded by University of Melbourne
Funding Acknowledgements
The research at the University of Melbourne and UNSW was funded by the Australian Research Council Centre of Excellence for Quantum Computation and Communication Technology (Grant No. CE170100012) and the US Army Research Office (Contracts No. W911NF-17-1-0200 and W911NF-23-1-0113). The authors acknowledge a grant from the University of Melbourne Research and Infrastructure Fund (RIF) and use of the facilities of the Australian National Fabrication Facility (ANFF) at the Melbourne Centre for Nanofabrication (MCN) and at UNSW. The authors acknowledge access to the NCRIS funded Heavy Ion Accelerator Capability at the University of Melbourne. S.G.R. and H.R.F. acknowledge the support of an Australian Government Research Training Program Scholarship. A.M.J. acknowledges an Australia-Germany Joint Research Cooperation Scheme (UA-DAAD) travel scholarship that supported collaboration with partner institutions in Germany. The authors are grateful to D. McCulloch of the RMIT Microscopy and Microanalysis Facility for use of SEM/FIB and TEM equipment. The views and conclusions contained in this document are those of the authors and should not be interpreted as representing the official policies, either expressed or implied, of the ARO or the US Government. The US Government is authorized to reproduce and distribute reprints for government purposes notwithstanding any copyright notation herein.