Structure determination at the atomic level from dynamical electron diffraction data under systematic row conditions

Abstract

We discuss a method to obtain structural information on crystals at the atomic level in high-resolution transmission electron microscopy from dynamical diffraction data under systematic row conditions. Working at a fixed incident energy and within an N-beam approximation, data is required at a well defined set of N incident beam orientations to determine the scattering matrix S, one orientation for each column in the matrix. At each orientation the corresponding column of the S-matrix is obtained by Fourier transformation of the exit surface wave function. Thus, in addition to each exit surface image, we must recover the phase of the wave function for that orientation in the image plane. We ..