Detailed tabulation of atomic form factors, photoelectric absorption and scattering cross section, and mass attenuation coefficients in the vicinity of absorption edges in the soft X-ray (Z = 30-36, Z = 60-89, E = 0.1-10 keV)--addressing convergence issues of earlier work.

Abstract

A new tabulation of atomic form factors is discussed briefly, extending the validity of the isolated atom approximation and serving as a baseline for near-edge solid-state and XAFS investigations. This is detailed by Chantler [J. Phys. Chem. Ref. Data, (2000), 29, 597-1048] and is the latest component of the FFAST tabulation of NIST.