Susceptibility of atomic force microscope cantilevers to lateral forces: Experimental verification
JE Sader, RC Sader
APPLIED PHYSICS LETTERS | AMER INST PHYSICS | Published : 2003
A study was performed on the susceptibility of atomic force microscope (AFM) cantilevers to lateral forces. The v-shaped cantilevers offered less resistance to lateral forces than rectangular cantilevers. The lateral resistance of the AFM cantilevers was independent of the length scale of the cantilever.