Journal article

Susceptibility of atomic force microscope cantilevers to lateral forces: Experimental verification

JE Sader, RC Sader

APPLIED PHYSICS LETTERS | AMER INST PHYSICS | Published : 2003

Abstract

A study was performed on the susceptibility of atomic force microscope (AFM) cantilevers to lateral forces. The v-shaped cantilevers offered less resistance to lateral forces than rectangular cantilevers. The lateral resistance of the AFM cantilevers was independent of the length scale of the cantilever.

University of Melbourne Researchers