Journal article

Nanoscale electrical characterization of trap-assisted quasibreakdown fluctuations in SiO2

CI Pakes, S Ramelow, S Prawer, DN Jamieson

Applied Physics Letters | AMER INST PHYSICS | Published : 2004

DOI: 10.1063/1.1712033

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Keywords

Model
Breakdown
Silicon
Physical Sciences
Oxides
Physics, Applied
Atomic-Force Microscopy
Physics
Science & Technology
Sio2-Films