Journal article

Full-foil x-ray mapping of integrated column density applied to the absolute determination of mass attenuation coefficients

MD de Jonge, Z Barnea, CQ Tran, CT Chantler

Measurement Science & Technology | IOP PUBLISHING LTD | Published : 2004

DOI: 10.1088/0957-0233/15/9/019

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Keywords

Monitoring Fluctuations
Absorption
Precision
Integrated Column Density
Engineering
Monochromators
Matched Ion Chambers
X-Ray
Technology
Silicon
Mass Attenuation Coefficient
Engineering, Multidisciplinary
Science & Technology
Full-Foil Mapping
Carbon
Energy-Range 5
Photoelectric Cross-Sections
Instruments & Instrumentation
International-Union