Retrieval of a complex-valued object from its diffraction pattern

Abstract

The exit surface wave function within the aperture was determined from a single diffraction patterns. Convergence tests were carried out for a wide range of complex-valued objects. An exit surface wave function was simulated for 100 keV electrons channeling through a silicon crystal of thickness 100 Å along the [001] direction. Simulations were performed in which 0.1% noise was added to the largest pixel value in the diffraction pattern, with correspondingly larger amounts of noise on less intense pixels, where the number of counts was lower.