Journal article

Interpretation of frequency modulation atomic force microscopy in terms of fractional calculus

JE Sader, SP Jarvis

Physical Review B | AMERICAN PHYSICAL SOC | Published : 2004

DOI: 10.1103/PhysRevB.70.012303

University of Melbourne Researchers

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Keywords

Physics, Applied
Technology
Physics
Probe
Materials Science
Resolution
Shifts
Science & Technology
Physical Sciences
Materials Science, Multidisciplinary
Physics, Condensed Matter