Journal article

Quantitative force measurements using frequency modulation atomic force microscopy - theoretical foundations

JE Sader, T Uchihashi, MJ Higgins, A Farrell, Y Nakayama, SP Jarvis

Nanotechnology | IOP PUBLISHING LTD | Published : 2005


Use of the atomic force microscope (AFM) in quantitative force measurements inherently requires a theoretical framework enabling conversion of the observed deflection properties of the cantilever to an interaction force. In this paper, the theoretical foundations of using frequency modulation atomic force microscopy (FM-AFM) in quantitative force measurements are examined and rigorously elucidated, with consideration being given to both 'conservative' and 'dissipative' interactions. This includes a detailed discussion of the underlying assumptions involved in such quantitative force measurements, the presentation of globally valid explicit formulae for evaluation of so-called 'conservative' ..

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University of Melbourne Researchers