Conference Proceedings
Investigation of dopant profiles in erbium doped optical fibres by ion microprobe and fluorescence confocal microscopy
F Sidiroglou, R Stern, IR Fletcher, ST Huntington, GW Baxter, A Roberts
Acoft Aos 2006 Australian Conference on Optical Fibre Technology Australian Optical Society | Published : 2006
Abstract
Dopant profiles in erbium doped optical fibres acquired by the application of fluorescence intensity based confocal microscopy technique and the employment of a Nanoscale-Secondary Ion Mass Spectrometry (NanoSIMS) system are presented and compared.