New opportunities in X-ray tomography

Abstract

We discuss standard X-ray-imaging techniques. Phase-imaging methods and a new class of nano-focus and nano-resolution laboratory systems offer new opportunities in true laboratory-based X-ray microtomography with a host of possible applications that have mainly been demonstrated only at synchrotron sources. Notwithstanding these advances, the diffraction limit for X-ray-imaging methods is a long way off. We preview the link between high-resolution 'standard' imaging schemes and the new field of coherent diffractive imaging. © 2006 Elsevier Ltd. All rights reserved.