Application of carbon nanotubes to topographical resolution enhancement of tapered fiber scanning near field optical microscopy probes
ST Huntington, SP Jarvis
REVIEW OF SCIENTIFIC INSTRUMENTS | AMER INST PHYSICS | Published : 2003
The attachment of carbon nanotubes to the scanning near field microscopy (SNOM) probes for substantial enhancement of topographical resolution was investigated. The tapered optical fiber tips of the SNOP probe with tip diameter in excess of 300 nm provide a poor topographical resolution. The robust and readily fabricated attachment of multiwalled carbon nanotubes provided better image quality without adversely affecting the optical resolution.