Journal article

Optical tomographic reconstruction of ion beam induced refractive index changes in silica

XM Goh, NM Dragomir, DN Jamieson, A Roberts, DX Belton

APPLIED PHYSICS LETTERS | AMER INST PHYSICS | Published : 2007

Abstract

Refractive index changes induced by ion beam implantation can be used to produce photonic devices such as waveguides. Here, we relate the measured three-dimensional changes in refractive index produced by ion beam implantation to modeling of the implantation process. We use a quantitative phase microscopic method in conjunction with a tomographic reconstruction process to determine the change in the refractive index distribution within a silica optical fiber that has been selectively implanted with 2.4 MeV H+ ions. The index profile is compared with numerical simulations of the ion vacancy and ionization using the stopping range of ions in matter program. © 2007 American Institute of Physics..

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