Journal article

Atomic force microscopy: Loading position dependence of cantilever spring constants and detector sensitivity

IU Vakarelski, SA Edwards, RR Dagastine, DYC Chan, GW Stevens, F Grieser

Review of Scientific Instruments | AMER INST PHYSICS | Published : 2007

Abstract

A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85 μm diameter) latex particles at various positions along the V-shaped cantilevers, we demonstrate how the normal and lateral spring constants as well as the sensitivity vary with loading position. Comparison with an explicit point-load theoretical model has also been used to verify the accuracy of the method. © 2007 American Institute of Physics.