Atomic force microscopy: Loading position dependence of cantilever spring constants and detector sensitivity
Ivan U Vakarelski, Scott A Edwards, Raymond R Dagastine, Derek YC Chan, Geoffrey W Stevens, Franz Grieser
REVIEW OF SCIENTIFIC INSTRUMENTS | AMER INST PHYSICS | Published : 2007
A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85 microm diameter) latex particles at various positions along the V-shaped cantilevers, we demonstrate how the normal and lateral spring constants as well as the sensitivity vary with loading position. Comparison with an explicit point-load theoretical model has also been used to verify the accuracy of the method.