Journal article

Spectroscopy and high-resolution microscopy of single nanocrystals by a focused ion beam registration method

Carolina Novo, Alison M Funston, Isabel Pastoriza-Santos, Luis M Liz-Marzan, Paul Mulvaney

ANGEWANDTE CHEMIE-INTERNATIONAL EDITION | WILEY-V C H VERLAG GMBH | Published : 2007

Abstract

Telling FIBs: Identification of the exact size and shape of a nanoparticle is crucial for direct comparison of experimental results with theoretical predictions. A focused ion beam (FIB) registration method enables routine spectroscopic and high-resolution microscopic experiments to be carried out on the same nanoparticle (see picture). (Graph Presented). © 2007 Wiley-VCH Verlag GmbH & Co. KGaA.

University of Melbourne Researchers