Journal article

Non-destructive micro-X-ray diffraction analysis of painted artefacts: Determination of detection limits for the chromium oxide-zinc oxide matrix

P Nel, D Lau, D Hay, N Wright

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | ELSEVIER SCIENCE BV | Published : 2006

Abstract

The development of micro-X-ray diffraction (micro-XRD) enables non-destructive, in situ analysis of crystalline pigments on artworks and archaeological objects. Pigments with X-ray diffraction patterns with large peak intensities may complicate the identification of other components with lower absorption coefficients, especially if present in low concentrations in the paint sample. Investigation of this issue involved: (1) micro-XRD examination and analysis of the amorphous and crystalline phases of fifteen pigment films and (2) micro-XRD examination and semi-quantitative analysis of various chromium oxide-zinc oxide mixtures, which established detection limits as low as 5 ± 2%. © 2006 Elsev..

View full abstract