Variations in properties of atomic force microscope cantilevers fashioned from the same wafer

Abstract

Variations in the mechanical properties of nominally identical V-shaped atomic force microscope (AFM) cantilevers sourced from the same silicon nitride wafer have been quantified by measuring the spring constants, resonant frequencies and quality factors of 101 specimens as received from the manufacturer using the thermal spectrum method of Hutter and Bechhoefer. The addition of thin gold coatings always lowers the resonant frequency but the corresponding spring constant can either increase or decrease as a result. The observed broad spread of spring constant values and the lack of correlations between the resonant frequency and spring constant can be attributed in part to the non-uniformity..