Journal article

Simulation of impulse response degradation from irradiation induced trapping and recombination regions in an InGaAs on InP photodetector

Jamie S Laird, Shinobu Onoda, Toshio Hirao, Hidenori Ohyama

Journal of Applied Physics | AMER INST PHYSICS | Published : 2008

DOI: 10.1063/1.2978368

University of Melbourne Researchers

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Keywords

P-I-N
Photodiodes
Si
Physics
In0.53ga0.47as
Radiation
Science & Technology
Level Transient Spectroscopy
Physics, Applied
Density
Impact Ionization
Damage
Numerical-Simulation
Physical Sciences