Journal article

Relaxation of high-energy heavy-ion induced bipolar plasmas in Si epilayer devices as a function of temperature

Jamie S Laird, Shinobu Onoda, Toshio Hirao

JOURNAL OF APPLIED PHYSICS | AMER INST PHYSICS | Published : 2008

Abstract

The electronic energy loss of high-energy heavy ions striking a reverse biased junction in an electronic component designed for space induces an electron-hole pair (or bipolar) plasma with ultrahigh injection levels contained within an ionization column of submicron radial dimensions. The relaxation of this highly nonequilibrium plasma induces a large transient current on nodes coupled to the field which propagate down through external circuits, the ramification of which in some devices depends on the transient pulse shape. Pulse shape depends on the bipolar plasma decay under space-charge screening conditions, which is itself a complex function of various parameters including the junction s..

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University of Melbourne Researchers