Journal article

Simulation of Atomic Resolution Images in STEM

LJ Allen, AJ D'Alfonso, M Bosman, SD Findlay, MP Oxley, VJ Keast, JM LeBeau, S Stemmer

Microscopy and Microanalysis | Cambridge University Press (CUP) | Published : 2008

DOI: 10.1017/s1431927608082019

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

University of Melbourne Researchers