Journal article
Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
PD Nellist, EC Cosgriff, G Behan, AI Kirkland, AJ D'Alfonso, SD Findlay, LJ Allen
Microscopy and Microanalysis | Cambridge University Press (CUP) | Published : 2008
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008