Journal article
Characterization of the back surface reflection in InP using femtosecond luminescence up-conversion
XM Wen, C Lincoln, TA Smith, LV Dao, P Hannaford
Journal of Physics D Applied Physics | Published : 2009
Abstract
In this investigation we study the behaviour of the emission from back surface reflection in InP using a femtosecond resolution up-conversion technique. The contributions from the direct emission and the back surface reflection are well distinguished. The experiments show unambiguously that the secondary rise in the time evolution of the luminescence originates from back surface reflection. Furthermore the emission from back surface reflection is used for a second excitation in the semiconductor nanostructures. © 2009 IOP Publishing Ltd.