Development and applications of accurate measurement of X-ray absorption

Abstract

Over recent synchrotron experiments and publications we have devel- oped methods for measuring the absorption coefficient in the XAFS (X-ray Absorption Fine Structure) region and far from an edge in neutral atoms, simple compounds and organometallics which can reach accuracies of below 0.02%. This is 50-500 times more accurate than earlier methods, and 50-250 times more accurate than claimed uncertainties in theoretical computations for these systems. The data and methodology is useful for a wide range of applications, including dominant synchrotron and laboratory techniques relating to fine structure, near-edge analysis and standard crystallography. The experiments are sensitive to many the..