Journal article

Development and applications of accurate measurement of X-ray absorption The X-ray extended range technique for high accuracy absolute XAFS by transmission and fluorescence

CT Chantler

The European Physical Journal. Special Topics | SPRINGER HEIDELBERG | Published : 2009

DOI: 10.1140/epjst/e2009-00985-8

University of Melbourne Researchers

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21Web of Science
20Scopus

Keywords

Atomic Form-Factors
Physics
Resolution
Silicon
Physical Sciences
Discrepancies
Mass Attenuation Coefficients
Scattering
Precision
Science & Technology
International-Union
Fine-Structure
Physics, Multidisciplinary
Copper