Journal article
Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images
JM Lebeau, AJ D'Alfonso, SD Findlay, S Stemmer, LJ Allen
Physical Review B Condensed Matter and Materials Physics | Published : 2009
Abstract
Quantitative, atomic resolution bright-field scanning transmission electron microscopy experiments are reported. The image intensities are placed on an absolute scale relative to the incident beam intensity. Features in the experimental images, such as contrast reversals, intensities, and the image contrast, are compared with image simulations that account for elastic scattering and the effect of phonon scattering. Simulations are carried out using both the multislice absorptive and frozen phonon simulation methods. For a SrTiO3 sample with thicknesses between 4 and 25 nm, both models agree within the experimental uncertainty. We demonstrate excellent agreement between the simulated and the ..
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Awarded by U.S. National Science Foundation
Awarded by Department of Energy
Awarded by U.S. Department of Education
Awarded by NSF
Funding Acknowledgements
The experimental research at UCSB was supported by the U.S. National Science Foundation (Grant No. DMR-0804631). S. S. also acknowledges the Department of Energy for support (Grant No. DE-FG02-06ER45994). J.M.L. also thanks the U.S. Department of Education under the GAANN program (Grant No. P200A07044) and the NSF-funded UCSB ICMR (Grant No. DMR-0409848) for a travel grant to Melbourne to work with L.J.A. The work made use of the UCSB MRL Central facilities supported by the MRSEC Program of the National Science Foundation under Award No. DMR 0520415. L.J.A. acknowledges support by the Australian Research Council. S. D. F. is supported by the Japan Society for the Promotion of Science (JSPS).