Journal article

Elemental and mineralogical study of earth-based pigments using particle induced X-ray emission and X-ray diffraction

P Nel, PA Lynch, JS Laird, HM Casey, LJ Goodall, CG Ryan, RJ Sloggett

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | ELSEVIER SCIENCE BV | Published : 2010

Abstract

Artwork and precious artefacts demand non-destructive analytical methodologies for art authentication, attribution and provenance assessment. However, structural and chemical characterisation represents a challenging problem with existing analytical techniques. A recent authentication case based on an Australian Aboriginal artwork, indicate there is substantial benefit in the ability of particle induced X-ray emission (PIXE), coupled with dynamic analysis (DA) to characterise pigments through trace element analysis. However, this information alone is insufficient for characterising the mineralogical residence of trace elements. For this reason a combined methodology based on PIXE and X-ray d..

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