Measurements of Electron Inelastic Mean Free Paths in Materials
JD Bourke, CT Chantler
PHYSICAL REVIEW LETTERS | AMER PHYSICAL SOC | Published : 2010
We present a method for determining inelastic mean free paths (IMFPs) in materials using high-accuracy measurements of x-ray absorption fine structure (XAFS). For electron energies below 100 eV, theoretical predictions have large variability and alternate measurement techniques exhibit significant uncertainties. In this regime, the short IMFP makes photoelectrons ideal for structural determination of surfaces and nanostructures, and measurements are valuable for studies of diverse fields such as low-energy electron diffraction and ballistic electron emission microscopy. Our approach, here applied to solid copper, is unique and exhibits enhanced sensitivity at electron energies below 100 eV. ..View full abstract
The authors acknowledge Y. Joly and J. L. Glover in our developments with FDMNES, and the experimental teams who measured our high accuracy XAFS data. We also acknowledge the ASRP for providing the funding for the experimental data used in this research.