Journal article

Micrometry combined with profile mapping for the absolute measurement of Integrated Column Density (ICD) and for accurate X-ray mass attenuation coefficients using XERT

M Tauhidul Islam, Nicholas A Rae, Jack L Glover, Zwi Barnea, Christopher T Chantler

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | ELSEVIER SCIENCE BV | Published : 2010

Abstract

Absolute values of the column densities [pt]c of four gold foils were measured using micrometry combined with the 2D X-ray attenuation profile. The absolute calibration of [pt]c was made with a reference foil and the [pt]c of other foils were determined following the thickness transfer method. By this method, we obtain absolute calibration to 0.1% or better which was not possible using only the X-ray map of a single foil over its central region. © 2009 Elsevier B.V. All rights reserved.