Journal article

Micrometry combined with profile mapping for the absolute measurement of Integrated Column Density (ICD) and for accurate X-ray mass attenuation coefficients using XERT

M Tauhidul Islam, Nicholas A Rae, Jack L Glover, Zwi Barnea, Christopher T Chantler

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | ELSEVIER SCIENCE BV | Published : 2010