Journal article
Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces
S Stemmer, JM LeBeau, SD Findlay, AJ D'Alfonso, LJ Allen
Microscopy and Microanalysis | Oxford University Press (OUP) | Published : 2010
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.