Journal article

Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces

S Stemmer, JM LeBeau, SD Findlay, AJ D'Alfonso, LJ Allen

Microscopy and Microanalysis | Cambridge University Press (CUP) | Published : 2010

DOI: 10.1017/s1431927610061684

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

University of Melbourne Researchers