Journal article
Standardless atom counting in scanning transmission electron microscopy
JM Lebeau, SD Findlay, LJ Allen, S Stemmer
Nano Letters | AMER CHEMICAL SOC | Published : 2010
DOI: 10.1021/nl102025s
Abstract
We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need for a calibration standard. We show that the method also provides for an approach to directly measure the finite effective source size of a scanning transmission electron microscope. © 2010 American Chemical Society.
Grants
Awarded by U.S. National Science Foundation
Awarded by U.S. Department of Education
Awarded by National Science Foundation
Funding Acknowledgements
The authors thank Junwoo Son for the deposition of the gold films. The research at UCSB was supported by the U.S. National Science Foundation (Grant DMR-0804631). J.M.L. also thanks the U.S. Department of Education for a grant under the GAANN program (Grant P200A07044). The work made use of the UCSB MRL Central facilities supported by the MRSEC Program of the National Science Foundation under award No. DMR-0520415. L.J.A. acknowledges support by the Australian Research Council.