Journal article

X-ray absorption fine structure for single crystals

Christopher T Chantler, Chanh Q Tran, Zwi Barnea

JOURNAL OF APPLIED CRYSTALLOGRAPHY | INT UNION CRYSTALLOGRAPHY | Published : 2010

Abstract

X-ray absorption fine structure measurements are a prime tool at synchrotrons around the world, accounting for over 30% of all synchrotron research. They are incisive tools for elucidating local structure, ionization state and coordination geometry. However, in general, it has not been possible to apply them to perfect or near-perfect crystals, and their dominant application is to micro-samples, powders, metals and solutions. The reasons for this are given, and an experimental technique to yield high-precision data for good crystals is developed. This widens the applicability of the technique dramatically, and permits standards and calibration samples to be used and transferred for new types..

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Grants

Awarded by US Department of Energy, Basic Energy Sciences, the Office of Energy Research


Funding Acknowledgements

This work was supported by the Australian Synchrotron Research Program which is funded by the Commonwealth of Australia under the Major National Research Facilities Program and by a number of grants of the Australia Research Council. Use of the Advanced Photon Source was supported by the US Department of Energy, Basic Energy Sciences, the Office of Energy Research, under contract No. W-31-109-Eng-38. We are grateful for the assistance of the synchrotron staff at beamline 20B of the Photon Factory in Tsukuba, Japan.