Current Transient Effect in N-channel 6H-SiC MOSFET Induced by Heavy Ion Irradiation

Kin Kiong Lee, Jamie S Laird, T Ohshima, S Onoda, T Hirao, H Itoh, AJ Bauer (ed.), P Friedrichs (ed.), M Krieger (ed.), G Pensl (ed.), R Rupp (ed.), T Seyller (ed.)