Journal article

Distortion in the thermal noise spectrum and quality factor of nanomechanical devices due to finite frequency resolution with applications to the atomic force microscope

John E Sader, Julian Sanelli, Barry D Hughes, Jason P Monty, Evan J Bieske

Review of Scientific Instruments | AMER INST PHYSICS | Published : 2011


Funding Acknowledgements

The authors would like to thank Ivan Marusic and Paul Mulvaney for useful discussions and access to equipment, and Jason Kilpatrick for experimental data. This research was supported by the Australian Research Council Grants Scheme.