Distortion in the thermal noise spectrum and quality factor of nanomechanical devices due to finite frequency resolution with applications to the atomic force microscope
John E Sader, Julian Sanelli, Barry D Hughes, Jason P Monty, Evan J Bieske
Review of Scientific Instruments | AMER INST PHYSICS | Published : 2011
The authors would like to thank Ivan Marusic and Paul Mulvaney for useful discussions and access to equipment, and Jason Kilpatrick for experimental data. This research was supported by the Australian Research Council Grants Scheme.