Conference Proceedings

Meeting the Design Challenges of nano-CMOS Electronics Design Automation and Test in Europe Workshop on Impact of Process Variability on Design and Test

A Asenov, R Sinnott, C Millar, S Roy, D Cumming, T Drysdale, S Furber, D Edwards, M Zwolinski, A Tyrrell, A Murray, S Pickles, D Berry

EGEE User Conference. Proceedings | EGEE | Published : 2008