Effect of annealing on the structural, electrical and magnetic properties of Gd-implanted ZnO thin films
PP Murmu, J Kennedy, BJ Ruck, GVM Williams, A Markwitz, S Rubanov, AA Suvorova
Journal of Materials Science | SPRINGER | Published : 2012
Awarded by Foundation for Research Science and Technology of New Zealand
We acknowledge funding from the Foundation for Research Science and Technology of New Zealand (C05X0408) and the MacDiarmid Institute. The authors are grateful to the New Zealand synchrotron group and the Soft X-ray Beamline scientist Dr. Bruce Cowie, and other staff at the Australian Synchrotron for their help. The authors acknowledge the assistance provided by Dr. Toby Hopf for SEM, and Dr. Shen Chong and Jibu Stephen for MPMS measurements. J. Leveneur is acknowledged for fruitful discussion of the XANES and MPMS data.