Spring constant calibration of atomic force microscope cantilevers of arbitrary shape
John E Sader, Julian A Sanelli, Brian D Adamson, Jason P Monty, Xingzhan Wei, Simon A Crawford, James R Friend, Ivan Marusic, Paul Mulvaney, Evan J Bieske
Review of Scientific Instruments | AMER INST PHYSICS | Published : 2012
The authors would like to thank the Melbourne Centre for Nanofabrication for access to the MSA-400 Micro System Analyzer, and Toby Ban, Jerome Eichenberger, and Mario Pineda from Polytec Headquarters, Irvine, CA, for use of the MSA-500 Micro System Analyzer. This research was supported by the Australian Research Council Grants Scheme. An iPhone application implementing the general method for the cantilevers used in this study is available from: http://www.ampc.ms.unimelb.edu.au/afm/.