Conference Proceedings
Hydrogen platelet evolution in mechanically strained silicon
DJ Pyke, RG Elliman, JC McCallum
Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings COMMAD | IEEE | Published : 2010
Abstract
The effect of intrinsic and applied stress on hydrogen diffusion and trapping are studied by elastic-recoil detection (ERD), Rutherford backscattering and channelling (RBS-C) and transmission electron microscopy (TEM). © 2010 IEEE.