Analytical Field-Effect Method for Extraction of Subgap States in Thin-Film Transistors
Sungsik Lee, Arman Ahnood, Sanjiv Sambandan, Arun Madan, Arokia Nathan
IEEE Electron Device Letters | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | Published : 2012
Awarded by EU
This work was supported in part by EU-FP7 Project ORAMA CP-IP 246334-2 and in part by the Royal Society Wolfson Research Merit Award, U. K. The review of this letter was arranged by Editor D. Ha.