Defect-induced performance degradation of 4H-SiC Schottky barrier diode particle detectors
N Iwamoto, BC Johnson, N Hoshino, M Ito, H Tsuchida, K Kojima, T Ohshima
Journal of Applied Physics | AMER INST PHYSICS | Published : 2013
Awarded by Japanese Society for the Promotion of Science (JSPS)
B.C.J. acknowledges financial support from the Japanese Society for the Promotion of Science (JSPS) (Grant-in-aid for Scientific Research, 22.00802).