Conference Proceedings

An Accurate Statistical Analysis of Random Dopant Induced Variability in 140,000 13nm MOSFETs

Dave Reid, Campbell Millar, Scott Roy, Gareth Roy, Richard Sinnott, Gordon Stewart, Graeme Stewart, Asen Asenov

Silicon Nanoelectronics Workshop. Proceedings | IEEE | Published : 2008

DOI: 10.1109/SNW.2008.5418478

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Keywords

Science & Technology
Technology
Science & Technology - Other Topics
Nanoscience & Nanotechnology
Engineering, Electrical & Electronic
Engineering