Surface Electronic Structure and Mechanical Characteristics of Copper-Cobalt Oxide Thin Film Coatings: Soft X-ray Synchrotron Radiation Spectroscopic Analyses and Modeling
Amun Amri, Zhong-Tao Jiang, Parisa A Bahri, Chun-Yang Yin, Xiaoli Zhao, Zonghan Xie, Xiaofei Duan, Hantarto Widjaja, M Mahbubur Rahman, Trevor Pryor
JOURNAL OF PHYSICAL CHEMISTRY C | AMER CHEMICAL SOC | Published : 2013
Novel copper-cobalt oxide thin films with different copper/cobalt molar ratios, namely, [Cu]/[Co] = 0.5, 1, and 2, have been successfully coated on aluminum substrates via a simple and cost-effective sol-gel dip-coating method. Coatings were characterized using high resolution synchrotron radiation X-ray photoelectron spectroscopy (SR-XPS) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy, in combination with nanomechanical testing and field emission scanning electron microscopy (FESEM). The surfaces of both [Cu]/[Co] = 0.5 and 1 samples consisted primarily of fine granular nanoparticles, whereas the [Cu]/[Co] = 2 has a smoother surface. The analyses reveal that the increas..View full abstract
We would like to acknowledge The University of Melbourne for the support of foundation beamtime. We also acknowledge the Australian Synchrotron for its travel support and Dr. Bruce Cowie and Dr. Anton Tadich of the Australian Synchrotron for their invaluable advice and expertise. M.M.Rahman. is highly grateful to the Murdoch University for providing a Ph.D. scholarship.