Deterministic electron ptychography at atomic resolution
AJ D'Alfonso, AJ Morgan, AWC Yan, P Wang, H Sawada, AI Kirkland, LJ Allen
PHYSICAL REVIEW B | AMER PHYSICAL SOC | Published : 2014
We present a fast deterministic approach to the ptychographic reconstruction of the transmission function of a specimen at atomic resolution. The method is demonstrated using a data set obtained from a cerium dioxide nanoparticle using an aberration-corrected electron microscope and is compared to established approaches to ptychography. The method is based on the solution of an overdetermined set of linear equations, and is computationally efficient and robust to measurement noise. The set of linear equations is efficiently solved using the conjugate gradient least squares method implemented using fast Fourier transforms. © 2014 American Physical Society.
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Awarded by Australian Research Council
Awarded by EPSRC
Awarded by Engineering and Physical Sciences Research Council
This research was supported under the Australian Research Council's Discovery Projects funding scheme (Project No. DP1096025) and its DECRA funding scheme (Project No. DE130100739) and by the EPSRC (Grants No. EP/E034055/1 and No. EP/F048009/1). The microscope was developed under the CREST R005 project, supported by the Japan Science and Technology Agency (Project leader: Kunio Takayanagi).