Efficient polarization beam splitter pixels based on a dielectric metasurface
M Khorasaninejad, W Zhu, KB Crozier
OPTICA | OPTICAL SOC AMER | Published : 2015
The polarization dependence of the reflection, refraction, and diffraction of electromagnetic waves from materials is measured in applications that extend from small (e.g., ellipsometry of semiconductor chips) to large scales (e.g., remote sensing for planetary science and weather radar). Such applications employ polarimeters that are in turn based on devices with polarization-selective absorption or reflection/refraction properties (e.g., prisms). The latter devices are generally bulky, thereby limiting their integration into compact systems. The former devices are inherently lossy, as they function by absorbing the unwanted polarization. Here, we experimentally demonstrate a conceptually n..View full abstract
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Awarded by Australian Research Council (ARC)
Awarded by National Science Foundation (NSF)
Australian Research Council (ARC) (DP150103736); National Science Foundation (NSF) (ECCS-1201687, ECCS-1307561).Fabrication work was carried out in the Harvard Center for Nanoscale Systems, which is supported by the NSF. We thank Dr. Ethan Schonbrun from the Rowland Institute at Harvard for lending us a light emitting diode.