Journal article

Surface determination through atomically resolved secondary-electron imaging

J Ciston, HG Brown, AJ D'Alfonso, P Koirala, C Ophus, Y Lin, Y Suzuki, H Inada, Y Zhu, LJ Allen, LD Marks

Nature Communications | NATURE PUBLISHING GROUP | Published : 2015

Grants

Awarded by DOE


Awarded by NSF


Awarded by DOE, Basic Energy Science, Material Science and Engineering Division


Awarded by Office of Science, Basic Energy Sciences of the U.S. Department of Energy


Awarded by Discovery Projects funding scheme of the Australian Research Council


Awarded by Discovery Early Career Researcher Award from the Australian Research Council


Awarded by Direct For Mathematical & Physical Scien


Awarded by Division Of Materials Research


Funding Acknowledgements

We acknowledge Mark Asta, Axel van de Walle, Oliver Warschkow, George Schatz and A. K. Rajagopal for useful discussions. L.D.M. and Y.L. acknowledge funding by the DOE on Grant No. DE-FG02-01ER45945; P.K. acknowledges funding by the NSF on grant number DMR-1206320. Y.Z. acknowledges funding by the DOE, Basic Energy Science, Material Science and Engineering Division under Contract No. DE-AC02-98CH10886. A portion of the electron microscopy experiments were performed at the NCEM facility of the Molecular Foundry, which is supported by the Office of Science, Basic Energy Sciences of the U.S. Department of Energy under Contract DE-AC02-05CH11231. This research was also supported under the Discovery Projects funding scheme of the Australian Research Council (Project No. DP110102228) and by a Discovery Early Career Researcher Award from the Australian Research Council (Project No. DE130100739).