An investigation of the critical thickness of film rupture and drainage phenomena using dual wavelength ellipsometry

Abstract

The effect of viscosity on the critical thickness of film rupture has been investigated using the new technique of dual wavelength ellipsometry. This technique enables accurate film thickness determination of a draining film between an approaching droplet and a liquid/liquid interface. Film drainage data for a polybutene/decane film between a water droplet and a bulk water phase was obtained over a range of film viscosities. Critical film thicknesses showed a dependence upon the film viscosity, and ranged from 1950 to 3454A for polybutene/decane film viscosities of 6.48-29.30x10-3Nsm-2 respectively. The magnitude of these critical film thickness values indicate that short range van der Waals..